Comment on “Robust Formation of Skyrmions and Topological Hall Effect Anomaly in Epitaxial Thin Films of MnSi”

Monchesky, T.  L., Loudon, J.  C., Robertson, M.  D., & Bogdanov, A.  N. (2014). Comment on “Robust Formation of Skyrmions and Topological Hall Effect Anomaly in Epitaxial Thin Films of MnSi”. Physical Review Letters. http://doi.org/10.1103/PhysRevLett.112.059701

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